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  Reflections on the Projection of Ions in Atom Probe Tomography

De Geuser, F., & Gault, B. (2017). Reflections on the Projection of Ions in Atom Probe Tomography. Microscopy and Microanalysis, 23(2), 238-246. doi:10.1017/S1431927616012721.

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Item Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-C4B8-2 Version Permalink: http://hdl.handle.net/11858/00-001M-0000-002D-C4BC-9
Genre: Journal Article

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 Creators:
De Geuser, Frédéric1, 2, Author              
Gault, Baptiste3, Author              
Affiliations:
1CNRS, SIMAP, F-38000 Grenoble, France, persistent22              
2Université Grenoble Alpes, SIMAP, F-38000 Grenoble, France, persistent22              
3Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              

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Language(s): eng - English
 Dates: 2017-02-022017-04
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1017/S1431927616012721
 Degree: -

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Title: Microscopy and Microanalysis
  Abbreviation : Microsc. Microanal.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: 9 Volume / Issue: 23 (2) Sequence Number: - Start / End Page: 238 - 246 Identifier: ISSN: 1431-9276
CoNE: /journals/resource/991042731793414