Bayesian Neural Networks and Applications to Speckle Data and Soft-X-Ray 
Diagnostics

von Toussaint, U.

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Bayesian Neural Networks and Applications to Speckle Data and Soft-X-Ray Diagnostics

von Toussaint, U. (2005). Bayesian Neural Networks and Applications to Speckle Data and Soft-X-Ray Diagnostics. Talk presented at Bereichsseminar. Garching. 2005-11-24.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-10D6-C Version Permalink: https://hdl.handle.net/21.11116/0000-0000-10D7-B

Genre: Talk

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Creators:
von Toussaint, U.^{1, 2}, Author

Affiliations:
1Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328
2Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856288

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 245183

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Title: Bereichsseminar

Place of Event: Garching

Start-/End Date: 2005-11-24

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