English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Talk

Bayesian Neural Networks and Applications to Speckle Data and Soft-X-Ray Diagnostics

MPS-Authors
/persons/resource/persons110652

von Toussaint,  U.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

von Toussaint, U. (2005). Bayesian Neural Networks and Applications to Speckle Data and Soft-X-Ray Diagnostics. Talk presented at Bereichsseminar. Garching. 2005-11-24.


Cite as: https://hdl.handle.net/21.11116/0000-0000-10D6-C
Abstract
There is no abstract available