Bayesian Analysis of Ellipsometry Measurements

von Toussaint, U.; Schwarz-Selinger, T.; Hopf, C.

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Bayesian Analysis of Ellipsometry Measurements

von Toussaint, U., Schwarz-Selinger, T., & Hopf, C. (2006). Bayesian Analysis of Ellipsometry Measurements. Poster presented at 26th International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering (MaxEnt 2006), Paris.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0000-145A-5 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0000-145C-3

Genre: Poster

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Urheber:
von Toussaint, U.¹, Autor
Schwarz-Selinger, T.¹, Autor
Hopf, C.^{1, 2}, Autor

Affiliations:
1Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328
2Experimental Plasma Physics 4 (E4), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856293