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Poster

Bayesian Analysis of Ellipsometry Measurements

MPS-Authors
/persons/resource/persons110652

von Toussaint,  U.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110460

Schwarz-Selinger,  T.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons109440

Hopf,  C.
Experimental Plasma Physics 4 (E4), Max Planck Institute for Plasma Physics, Max Planck Society;
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

von Toussaint, U., Schwarz-Selinger, T., & Hopf, C. (2006). Bayesian Analysis of Ellipsometry Measurements. Poster presented at 26th International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering (MaxEnt 2006), Paris.


Cite as: https://hdl.handle.net/21.11116/0000-0000-145A-5
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