Bayesian Analysis of Ellipsometry Measurements

von Toussaint, U.; Schwarz-Selinger, T.; Hopf, C.

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Bayesian Analysis of Ellipsometry Measurements

von Toussaint, U., Schwarz-Selinger, T., & Hopf, C. (2006). Bayesian Analysis of Ellipsometry Measurements. Poster presented at 26th International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering (MaxEnt 2006), Paris.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-145A-5 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-145C-3

Genre: Poster

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Creators:
von Toussaint, U.¹, Author
Schwarz-Selinger, T.¹, Author
Hopf, C.^{1, 2}, Author

Affiliations:
1Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856328
2Experimental Plasma Physics 4 (E4), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856293

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 281039

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Title: 26th International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering (MaxEnt 2006)

Place of Event: Paris

Start-/End Date: 2006-07-08 - 2006-07-12

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