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  Bayesian derivation of electron temperature profile using JET ECE diagnostics

Schmuck, S., Svensson, J., de la Luna, E., Figini, L., Johnson, T., Alper, B., et al. (2011). Bayesian derivation of electron temperature profile using JET ECE diagnostics. Poster presented at 38th EPS Conference on Plasma Physics, Strasbourg.

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 Creators:
Schmuck, S.1, Author           
Svensson, J.1, 2, Author           
de la Luna, E.3, Author
Figini, L.3, Author
Johnson, T.3, Author
Alper, B.3, Author
Beurskens, M.4, Author           
Fessey, J.3, Author
Gerbaud, T.3, Author
Sirinelli, A.3, Author
JET EFDA Contributors, Author  
Affiliations:
1W7-X: Physics (PH), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856305              
2W7-X: Heating and CoDaC (HC), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856306              
3JET-EFDA, Culham Science Centre, Abingdon, OX14 3DB, UK; Laboratorio Nacional de Fusion, Asociacion EURATOM-CIEMAT, Madrid, Spain; Istituto di Fisica del Plasma, CNR, Euratom-ENEA-CNR Association, Milano, Italy; Association EURATOM-VR, Fusion Plasma Physics, EES, KTH, SE-10044 Stockholm, Sweden; Euratom/CCFE Fusion Association, Culham Science Centre, Abingdon, Oxon, OX14 3DB, UK; FOM Institute for Plasma Physics Rijnhuizen, Association EURATOM-FOM, Trilateral Euregio Cluster, The Netherlands, ou_persistent22              
4External Organizations, ou_persistent22              

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Language(s): eng - English
 Dates:
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 569814
 Degree: -

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Title: 38th EPS Conference on Plasma Physics
Place of Event: Strasbourg
Start-/End Date: 2011-06-27 - 2011-07-01

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