Information depth of low-energy ion scattering in the reionization regime

Primetzhofer, D.; Spitz, M.; Bauer, P.; Taglauer, E.

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Information depth of low-energy ion scattering in the reionization regime

Primetzhofer, D., Spitz, M., Bauer, P., & Taglauer, E. (2012). Information depth of low-energy ion scattering in the reionization regime. Poster presented at 25th Symposium on Surface Science 2012 (3S'12), St. Christoph/Arlberg.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0000-87EA-0 Version Permalink: https://hdl.handle.net/21.11116/0000-0000-87EC-E

Genre: Poster

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Creators:
Primetzhofer, D., Author
Spitz, M., Author
Bauer, P.¹, Author
Taglauer, E.², Author

Affiliations:
1External Organizations, ou_persistent22
2Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856327

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Language(s): eng - English

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Publication Status: Not specified

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Identifiers: eDoc: 605701

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Title: 25th Symposium on Surface Science 2012 (3S'12)

Place of Event: St. Christoph/Arlberg

Start-/End Date: 2012-03-11 - 2012-03-17

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