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  Evaluation of EELS spectrum imaging data by spectral components and factors from multivariate analysis

Zhang, S., & Scheu, C. (2018). Evaluation of EELS spectrum imaging data by spectral components and factors from multivariate analysis. Microscopy, 67(suppl_1), i133-i141. doi:10.1093/jmicro/dfx091.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-4978-7 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-497A-5
Genre: Journal Article

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 Creators:
Zhang, Siyuan1, Author              
Scheu, Christina1, 2, Author              
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Materials Analytics, RWTH Aachen University, Kopernikusstrasse 10, Aachen, Germany, ou_persistent22              

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Language(s): eng - English
 Dates: 2017-11-092018-03-01
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: -
 Identifiers: ISSN: 2050-5698
DOI: 10.1093/jmicro/dfx091
 Degree: -

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Title: Microscopy
  Other : Journal of Electron Microscopy
Source Genre: Journal
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Publ. Info: Oxford, UK : Oxford University Press
Pages: - Volume / Issue: 67 (suppl_1) Sequence Number: - Start / End Page: i133 - i141 Identifier: ISSN: 2050-5698
CoNE: /journals/resource/2050-5698