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  Yield stress influenced by the ratio of wire diameter to grain size – a competition between the effects of specimen microstructure and dimension in micro-sized polycrystalline copper wires

Yang, B., Motz, C., Rester, M., & Dehm, G. (2012). Yield stress influenced by the ratio of wire diameter to grain size – a competition between the effects of specimen microstructure and dimension in micro-sized polycrystalline copper wires. Philosophical Magazine Letters; Nano-mechanical testing in materials research and development III, 92(25-27), 3243-3256. doi:10.1080/14786435.2012.693215.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-8BD9-E Version Permalink: http://hdl.handle.net/21.11116/0000-0001-8BDA-D
Genre: Journal Article

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 Creators:
Yang, Bo1, 2, Author              
Motz, Christian2, Author              
Rester, Martin3, Author              
Dehm, Gerhard2, 4, Author              
Affiliations:
1Materials Center Leoben, Forschungs GmbH, Leoben, Austria, ou_persistent22              
2Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Leoben, Austria, ou_persistent22              
3Department of Materials Physics, Montanuniversität Leoben, Leoben, Austria, ou_persistent22              
4Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              

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Language(s): eng - English
 Dates: 2012-09-01
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1080/14786435.2012.693215
 Degree: -

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Title: Philosophical Magazine Letters; Nano-mechanical testing in materials research and development III
  Abbreviation : Philos. Mag. Lett.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: -
Pages: - Volume / Issue: 92 (25-27) Sequence Number: - Start / End Page: 3243 - 3256 Identifier: ISSN: 0950-0839
CoNE: https://pure.mpg.de/cone/journals/resource/954925271392