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  Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a twodimensional energy-dispersive detector

Abboud, A., Kirchlechner, C., Kečkéš, J., Çonka-Nurdan, T., Send, S., Micha, J.-S., et al. (2017). Single-shot full strain tensor determination with microbeam X-ray Laue diffraction and a twodimensional energy-dispersive detector. Journal of Applied Crystallography, 50(3), 901-908. doi:10.1107/S1600576717005581.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0001-6EE3-4 Version Permalink: http://hdl.handle.net/21.11116/0000-0001-6EF1-4
Genre: Journal Article

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 Creators:
Abboud, Ali1, Author              
Kirchlechner, Christoph2, 3, Author              
Kečkéš, Jozef4, Author              
Çonka-Nurdan, Tuba5, Author              
Send, Sebastian1, Author              
Micha, Jean-Sebastien6, Author              
Ulrich, Oliver7, Author              
Hartmann, Robert8, Author              
Strüderf, L.9, Author              
Pietsch, Ullrich1, Author              
Affiliations:
1Department of Physics, University of Siegen, Siegen, Germany, ou_persistent22              
2Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863401              
3Department of Materials Physics, Montanuniversität Leoben, Austria, ou_persistent22              
4Department of Materials Physics, Montanuniversität Leoben, Leoben, Austria, ou_persistent22              
5Fakultät für Ingenieurwissenschaften, Türkish German Universität, Sahinkaya Caddesi 86, Istanbul, Turkey, persistent22              
6CEA-Grenoble, Institut Nanosciences et Cryogénie, Grenoble, France, ou_persistent22              
7CEA-Grenoble/DRFMC/SprAM, 17 rue des Martyrs, Grenoble Cedex 9, France, ou_persistent22              
8PNSensor GmbH, Otto-Hahn-Ring 6, München, Germany, persistent22              
9Department of Physics, University of Siegen, Siegen, Germany, persistent22              

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Free keywords: Crystal orientation; Single crystals; Strain; Synchrotron radiation; X ray apparatus; X ray diffraction, Energy dispersive detectors; Energy dispersive x-ray; Experimental procedure; Hydrostatic components; Lattice spacing; Laue diffraction; Laue diffraction patterns; Strain and stress, Tensors
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Language(s): eng - English
 Dates: 2017-06
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1107/S1600576717005581
BibTex Citekey: Abboud2017901
 Degree: -

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Title: Journal of Applied Crystallography
  Abbreviation : J. Appl. Cryst.
Source Genre: Journal
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Publ. Info: Oxford, England : Blackwell Publishing on behalf of the International Union of Crystallography
Pages: - Volume / Issue: 50 (3) Sequence Number: - Start / End Page: 901 - 908 Identifier: ISSN: 0021-8898
CoNE: /journals/resource/954925410812