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  Bending Rigidity of 2D Silica

Büchner, C., Eder, S., Nesse, T., Kuhness, D., Schlexer, P., Pacchioni, G., et al. (2018). Bending Rigidity of 2D Silica. Physical Review Letters, 120(22): 226101. doi:10.1103/PhysRevLett.120.226101.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0001-8AAB-3 Version Permalink: https://hdl.handle.net/21.11116/0000-000D-1D60-7
Genre: Journal Article

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PhysRevLett.120.226101.pdf (Publisher version), 2MB
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 Creators:
Büchner, Christin1, Author           
Eder, S. D.2, Author
Nesse, T.3, Author
Kuhness, David1, Author           
Schlexer, P.4, Author
Pacchioni, G.4, Author
Manson, J. R.5, 6, Author
Heyde, Markus1, Author           
Holst, B.2, Author
Freund, Hans-Joachim1, Author           
Affiliations:
1Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022              
2Department of Physics and Technology, University of Bergen, Allégaten 55, 5007 Bergen, Norway, ou_persistent22              
3Department of Physics, NTNU Norwegian University of Science and Technology, NO-7491 Trondheim, Norway, ou_persistent22              
4Department of Materials Science, Universitá di Milano-Bicocca, Via R. Cozzi, 55, Milan, Italy, ou_persistent22              
5Department of Physics and Astronomy, Clemson University, Clemson, South Carolina 29634, USA, ou_persistent22              
6Donostia International Physics Center (DIPC), Paseo Manuel de Lardizabal, 4, 20018 Donostia-San Sebastian, Spain, ou_persistent22              

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 Abstract: A chemically stable bilayers of SiO2 (2D silica) is a new, wide band gap 2D material. Up till now graphene has been the only 2D material where the bending rigidity has been measured. Here we present inelastic helium atom scattering data from 2D silica on Ru(0001) and extract the first bending rigidity, κ, measurements for a nonmonoatomic 2D material of definable thickness. We find a value of κ=8.8  eV±0.5  eV which is of the same order of magnitude as theoretical values in the literature for freestanding crystalline 2D silica.

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Language(s): eng - English
 Dates: 2017-10-192018-05-302018-06-01
 Publication Status: Issued
 Pages: 6
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1103/PhysRevLett.120.226101
 Degree: -

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Project name : CRYVISIL - Crystalline and vitreous silica films and their interconversion
Grant ID : 669179
Funding program : Horizon 2020 (H2020)
Funding organization : European Commission (EC)

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Title: Physical Review Letters
  Abbreviation : Phys. Rev. Lett.
Source Genre: Journal
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Publ. Info: Woodbury, N.Y. : American Physical Society
Pages: 6 Volume / Issue: 120 (22) Sequence Number: 226101 Start / End Page: - Identifier: ISSN: 0031-9007
CoNE: https://pure.mpg.de/cone/journals/resource/954925433406_1