Increased detector efficiency helps to reveal new insights into compositional 
fluctuations at defects in Cu2ZnSnSe4 thin films

Schwarz, Torsten; Redinger, Alex; Siebentritt, Susanne; Gault, Baptiste; Raabe, Dierk; Choi, Pyuck-Pa

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Increased detector efficiency helps to reveal new insights into compositional fluctuations at defects in Cu₂ZnSnSe₄ thin films

Schwarz, T., Redinger, A., Siebentritt, S., Gault, B., Raabe, D., & Choi, P.-P. (2018). Increased detector efficiency helps to reveal new insights into compositional fluctuations at defects in Cu₂ZnSnSe₄ thin films. Poster presented at APT&M 2018, NIST, Gaithersburg, MD, USA.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0001-D5E3-E Versions-Permalink: https://hdl.handle.net/21.11116/0000-0001-D5E4-D

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Urheber:
Schwarz, Torsten¹, Autor
Redinger, Alex², Autor
Siebentritt, Susanne², Autor
Gault, Baptiste¹, Autor
Raabe, Dierk³, Autor
Choi, Pyuck-Pa⁴, Autor

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2University of Luxembourg, Laboratory for Photovoltaics, 41, rue du Brill, L-4422, Belvaux, Luxembourg, ou_persistent22
3Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863381
4Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea, ou_persistent22