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  In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X

Kring, J., Pablant, N., Langenberg, A., Rice, J., Delgado-Aparicio, L., Maurer, D., et al. (2018). In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X. Review of Scientific Instruments, 89: 10F107. doi:10.1063/1.5038809.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0002-84AB-8 Version Permalink: https://hdl.handle.net/21.11116/0000-0004-43CC-B
Genre: Journal Article

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kring_in situ.pdf (Supplementary material), 2MB
 
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https://doi.org/10.1063/1.5038809 (Publisher version)
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 Creators:
Kring, J.1, Author
Pablant, N.1, Author
Langenberg, A.2, Author           
Rice, J.1, Author
Delgado-Aparicio, L.1, Author
Maurer, D.1, Author
Traverso, P.1, Author
Bitter, M.1, Author
Hill, K.1, Author
Reinke, M.1, Author
Affiliations:
1External Organizations, ou_persistent22              
2Stellarator Heating and Optimisation (E3), Max Planck Institute for Plasma Physics, Max Planck Society, ou_2040305              

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Free keywords: Konferenzbeitrag
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Language(s): eng - English
 Dates: 2018
 Publication Status: Issued
 Pages: 5 p.
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1063/1.5038809
 Degree: -

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Project name : Euratom Research and Training Programme 2014-2018 – EUROfusion
Grant ID : 633053
Funding program : Horizon 2020 (H2020)
Funding organization : European Commission (EC)

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Title: Review of Scientific Instruments
  Abbreviation : Rev. Sci. Instrum.
  Subtitle : 22nd Biannual Topical Conference on High-Temperature Plasma Diagnostics (HTPD 2018), San Diego, CA, 2019-04-16 to 2018-04-19
Source Genre: Journal
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Publ. Info: Melville, NY : AIP Publishing
Pages: - Volume / Issue: 89 Sequence Number: 10F107 Start / End Page: - Identifier: ISSN: 0034-6748
CoNE: https://pure.mpg.de/cone/journals/resource/991042742033452