XPS-Mapping of a Membrane Reactor Surface: Vanadium Oxidation State Variations

Suchorski, Y.; Rihko-Struckmann, L.; Ye, Y.; Sundmacher, K.; Weiß, H.

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XPS-Mapping of a Membrane Reactor Surface: Vanadium Oxidation State Variations

Suchorski, Y., Rihko-Struckmann, L., Ye, Y., Sundmacher, K., & Weiß, H. (2005). XPS-Mapping of a Membrane Reactor Surface: Vanadium Oxidation State Variations. Poster presented at IWSP-2005, Polanica-Zdrój, Poland.

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Datensatz-Permalink: https://hdl.handle.net/21.11116/0000-0003-8A7A-9 Versions-Permalink: https://hdl.handle.net/21.11116/0000-0003-8A7B-8

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Urheber:
Suchorski, Y.¹, Autor
Rihko-Struckmann, L.¹, Autor
Ye, Y.¹, Autor
Sundmacher, K.^{1, 2}, Autor
Weiß, H.¹, Autor

Affiliations:
1Process Systems Engineering, Max Planck Institute for Dynamics of Complex Technical Systems, Max Planck Society, ou_1738151
2Otto-von-Guericke-Universität Magdeburg, External Organizations, ou_1738156