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  Characterization of a nanotip electron source for femtosecond point-projection microscopy

Malter, J. (2017). Characterization of a nanotip electron source for femtosecond point-projection microscopy. Bachelor Thesis, Freie Universität, Berlin.

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 Creators:
Malter, Jannik1, Author           
Wolf, Martin1, Referee           
Behrends, Jan, Referee
Affiliations:
1Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546              

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Language(s): eng - English
 Dates: 2017
 Publication Status: Accepted / In Press
 Pages: 33
 Publishing info: Berlin : Freie Universität
 Table of Contents: -
 Rev. Type: -
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 Degree: Bachelor

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