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  Anomalous formation of micrometer-thick amorphous oxide surficial layers during high-temperature oxidation of ZrAl2

Hu, Z., Xu, Y., Chen, Y., Schützendübe, P., Wang, J., Huang, Y., et al. (2019). Anomalous formation of micrometer-thick amorphous oxide surficial layers during high-temperature oxidation of ZrAl2. Journal of Materials Science & Technology, 35(7), 1479-1484. doi:10.1016/j.jmst.2019.02.005.

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 Creators:
Hu, Zhangping1, Author
Xu, Yifei1, Author
Chen, Yuanyuan1, Author
Schützendübe, Peter2, Author           
Wang, Jiangyong3, Author
Huang, Yuan1, Author
Liu, Yongchang1, Author
Wang, Zumin1, Author
Affiliations:
1School of Materials Science and Engineering, Tianjin University, Tianjin, 300350, China, ou_persistent22              
2Central Scientific Facility Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640              
3Department of Physics, Shantou University, Shantou, 515063, China, ou_persistent22              

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Free keywords: ZWE Materialien
 Abstract: -

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Language(s): eng - English
 Dates: 2019-02-26
 Publication Status: Published online
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/j.jmst.2019.02.005
 Degree: -

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Title: Journal of Materials Science & Technology
  Other : J. Mater. Sci. Technol.
Source Genre: Journal
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Affiliations:
Publ. Info: Shenyang, China : Editorial Board of Journal of Materials Science and Technology
Pages: - Volume / Issue: 35 (7) Sequence Number: - Start / End Page: 1479 - 1484 Identifier: ISSN: 1005-0302
CoNE: https://pure.mpg.de/cone/journals/resource/954925584235