Tailoring metal film texture by use of high atomic mobility at 
metalsemiconductor interfaces

Wang, Jing; Schützendübe, Peter; Qiu, Yongxing; Wang, Jiangyong; Huang, Yuan; Liu, Yongchang; Wang, Zumin

doi:10.1016/j.apsusc.2018.12.260

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Tailoring metal film texture by use of high atomic mobility at metalsemiconductor interfaces

Wang, J., Schützendübe, P., Qiu, Y., Wang, J., Huang, Y., Liu, Y., et al. (2019). Tailoring metal film texture by use of high atomic mobility at metalsemiconductor interfaces. Applied Surface Science, 475, 117-123. doi:10.1016/j.apsusc.2018.12.260.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0004-5979-1 Version Permalink: https://hdl.handle.net/21.11116/0000-0004-597A-0

Genre: Journal Article

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Creators:
Wang, Jing¹, Author
Schützendübe, Peter², Author
Qiu, Yongxing³, Author
Wang, Jiangyong⁴, Author
Huang, Yuan¹, Author
Liu, Yongchang¹, Author
Wang, Zumin¹, Author

Affiliations:
1School of Materials Science and Engineering, Tianjin University, Tianjin 300350, China, ou_persistent22
2Central Scientific Facility Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640
3Suzhou Institute of Nano-tech and Nano-bionics (SINANO), Chinese Academy of Science, Suzhou 215123, China, ou_persistent22
4Department of Physics, Shantou University, Shantou 515063, China, ou_persistent22

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Free keywords: ZWE Materialien

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Language(s): eng - English

Dates: Published Online: 2018-12-28Date issued: 2019-05-01

Publication Status: Issued

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Rev. Type: Peer

Identifiers: DOI: 10.1016/j.apsusc.2018.12.260

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Title: Applied Surface Science

Abbreviation : Appl. Surf. Sci.

Source Genre: Journal

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Publ. Info: Amsterdam : Elsevier B.V.

Pages: - Volume / Issue: 475 Sequence Number: - Start / End Page: 117 - 123 Identifier: ISSN: 0169-4332
CoNE: https://pure.mpg.de/cone/journals/resource/954928576736