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  New Applications to Atom Probe Tomography: Insights on Trace Element Diffusion in Naturally Deformed Minerals

Dubosq, R., Gault, B., Rogowitz, A., Schweinar, K., Zaefferer, S., & Schneider, D. (2019). New Applications to Atom Probe Tomography: Insights on Trace Element Diffusion in Naturally Deformed Minerals. Microscopy and Microanalysis, 25(S2), 2498-2499. doi:10.1017/S1431927619013229.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0004-A0FB-C Version Permalink: http://hdl.handle.net/21.11116/0000-0004-A0FF-8
Genre: Journal Article

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 Creators:
Dubosq, Renelle1, Author              
Gault, Baptiste2, 3, Author              
Rogowitz, Anna4, Author              
Schweinar, Kevin2, Author              
Zaefferer, Stefan5, Author              
Schneider, David1, Author              
Affiliations:
1Department of Earth and Environmental Sciences, University of Ottawa, Ottawa, Canada, ou_persistent22              
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
3Department of Materials, Royal School of Mines, Imperial College London, London, UK, ou_persistent22              
4Department of Geodynamics and Sedimentology, University of Vienna, Vienna, Austria, ou_persistent22              
5Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863391              

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Language(s): eng - English
 Dates: 2019-08-052019-08
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Method: Peer
 Identifiers: DOI: 10.1017/S1431927619013229
 Degree: -

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Title: Microscopy and Microanalysis
  Abbreviation : Microsc. Microanal.
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 25 (S2) Sequence Number: - Start / End Page: 2498 - 2499 Identifier: ISSN: 1431-9276
CoNE: https://pure.mpg.de/cone/journals/resource/991042731793414