Dubosq, R., Gault, B., Rogowitz, A., Schweinar, K., Zaefferer, S., & Schneider, D. (2019). New Applications to Atom Probe Tomography: Insights on Trace Element Diffusion in Naturally Deformed Minerals. Microscopy and Microanalysis, 25(S2), 2498-2499. doi:10.1017/S1431927619013229.