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  Novel test sample for submicron ion-beam analysis

Spemann, D., Reinert, T., Vogt, J., Butz, T., Otte, K., & Zimmer, K. (2001). Novel test sample for submicron ion-beam analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 181(1-4), 186-192. doi:10.1016/S0168-583X(01)00362-7.

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Genre: Journal Article

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 Creators:
Spemann, D.1, Author
Reinert, Tilo1, Author           
Vogt, J.1, Author
Butz, T.1, Author
Otte, K.2, Author
Zimmer, K.2, Author
Affiliations:
1Nukleare Festkörperphysik, University of Leipzig, Germany, ou_persistent22              
2Abt. Ionenstrahltechnik, Institut für Oberflächenmodifizierung e.V., Leipzig, Germany, ou_persistent22              

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Free keywords: Test sample; Electron beam lithography; Submicron beam spot sizes; Properties of scanning system; Beam profile
 Abstract: In order to determine the beam spot size, scan size and scanning properties of a nuclear microprobe system a novel test sample with nanometer structures for the use in submicron ion--beam analysis has been developed by the University of...

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Language(s): eng - English
 Dates: 2001-09-062001-07
 Publication Status: Published in print
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1016/S0168-583X(01)00362-7
BibTex Citekey: Spemann:2001
 Degree: -

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Title: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
  Abbreviation : NIM B
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Amsterdam : Elsevier B.V.
Pages: - Volume / Issue: 181 (1-4) Sequence Number: - Start / End Page: 186 - 192 Identifier: ISSN: 0168-583X
CoNE: https://pure.mpg.de/cone/journals/resource/954925484704