Detection of trace impurities and other defects in functional nanomaterials

Lim, Joohyun; Kim, Se-Ho; Sahu, Rajib; Aymerich Armengol, Raquel; Kasian, Olga; Choi, Pyuck-Pa; Stephenson, Leigh; Gault, Baptiste; Scheu, Christina

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Detection of trace impurities and other defects in functional nanomaterials

Lim, J., Kim, S.-H., Sahu, R., Aymerich Armengol, R., Kasian, O., Choi, P.-P., et al. (2019). Detection of trace impurities and other defects in functional nanomaterials. Talk presented at International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano 2019. Düsseldorf, Germany. 2019-10-27 - 2019-10-30.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0005-469D-C Version Permalink: https://hdl.handle.net/21.11116/0000-0005-46B2-3

Genre: Talk

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Creators:
Lim, Joohyun¹, Author
Kim, Se-Ho², Author
Sahu, Rajib¹, Author
Aymerich Armengol, Raquel¹, Author
Kasian, Olga³, Author
Choi, Pyuck-Pa⁴, Author
Stephenson, Leigh², Author
Gault, Baptiste², Author
Scheu, Christina¹, Author

Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
3Electrocatalysis, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863354
4Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea, ou_persistent22

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Language(s): eng - English

Dates: Created: 2019-10

Publication Status: Not specified

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Title: International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano 2019

Place of Event: Düsseldorf, Germany

Start-/End Date: 2019-10-27 - 2019-10-30

Invited: Yes

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