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  3D Reconstruction of Identical Location Electron Micrographs – Methodology and Pitfalls

Gänsler, T., Hengge, K. A., & Scheu, C. (2019). 3D Reconstruction of Identical Location Electron Micrographs – Methodology and Pitfalls. Poster presented at IAMNano 2019, International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, Düsseldorf, Germany.

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Item Permalink: http://hdl.handle.net/21.11116/0000-0005-6F28-3 Version Permalink: http://hdl.handle.net/21.11116/0000-0005-6F29-2
Genre: Poster

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 Creators:
Gänsler, Thomas1, Author              
Hengge, Katharina Anna1, Author              
Scheu, Christina1, Author              
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              

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Language(s): eng - English
 Dates: 2019-10
 Publication Status: Not specified
 Pages: -
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 Rev. Method: -
 Identifiers: -
 Degree: -

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Title: IAMNano 2019, International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices
Place of Event: Düsseldorf, Germany
Start-/End Date: 2019-10-27 - 2019-10-30

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