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  Direct Imaging of Dopant and Impurity Distributions in 2D MoS2

Kim, S.-H., Lim, J., Sahu, R., Kasian, O., Stephenson, L., Scheu, C., et al. (2020). Direct Imaging of Dopant and Impurity Distributions in 2D MoS2. Advanced Materials, 32(8): 1907235. doi:10.1002/adma.201907235.

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adma.201907235.pdf (Publisher version), 2MB
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2020
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Published by WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and repro- duction in any medium, provided the original work is properly cited
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 Creators:
Kim, Se-Ho1, Author           
Lim, Joohyun2, Author           
Sahu, Rajib2, Author           
Kasian, Olga3, 4, Author           
Stephenson, Leigh1, Author           
Scheu, Christina2, Author           
Gault, Baptiste1, 5, Author           
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
3Electrocatalysis, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863354              
4Helmholtz Zentrum Berlin, Helmholtz-Institute Erlangen-Nürnberg, 14109 Berlin, Germany, ou_persistent22              
5Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK, ou_persistent22              

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Language(s): eng - English
 Dates: 2020-01-132020
 Publication Status: Issued
 Pages: -
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 Rev. Type: -
 Identifiers: DOI: 10.1002/adma.201907235
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Title: Advanced Materials
  Other : Adv. Mater.
Source Genre: Journal
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Pages: 6 Volume / Issue: 32 (8) Sequence Number: 1907235 Start / End Page: - Identifier: ISSN: 0935-9648
CoNE: https://pure.mpg.de/cone/journals/resource/954925570855