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  Atomic‐Scale Mapping of Impurities in Partially Reduced Hollow TiO2 Nanowires

Lim, J., Kim, S.-H., Aymerich Armengol, R., Kasian, O., Choi, P.-P., Stephenson, L., et al. (2020). Atomic‐Scale Mapping of Impurities in Partially Reduced Hollow TiO2 Nanowires. Angewandte Chemie, International Edition in English, 59(14), 5651-5655. doi:10.1002/anie.201915709.

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 Creators:
Lim, Joohyun1, Author           
Kim, Se-Ho2, 3, Author           
Aymerich Armengol, Raquel1, Author           
Kasian, Olga4, 5, Author           
Choi, Pyuck-Pa6, Author           
Stephenson, Leigh2, 3, Author           
Gault, Baptiste2, 3, 7, Author           
Scheu, Christina1, Author           
Affiliations:
1Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_2054294              
2Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
3Hydrogen in Energy Materials, Project Groups, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_3291873              
4Electrocatalysis, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863354              
5Helmholtz Zentrum Berlin, Helmholtz-Institute Erlangen-Nürnberg, 14109 Berlin, Germany, ou_persistent22              
6Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 34141, Korea, ou_persistent22              
7Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK, ou_persistent22              

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Language(s): eng - English
 Dates: 2020-02-102020-03-27
 Publication Status: Issued
 Pages: -
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 Identifiers: DOI: 10.1002/anie.201915709
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Title: Angewandte Chemie, International Edition in English
  Abbreviation : Angew. Chem., Int. Ed. Engl.
Source Genre: Journal
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Pages: 6 Volume / Issue: 59 (14) Sequence Number: - Start / End Page: 5651 - 5655 Identifier: ISSN: 0570-0833
CoNE: https://pure.mpg.de/cone/journals/resource/0570-0833