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  Reflection high-energy electron diffraction and 119sn mössbauer investigation of epitaxial α-sn films

Roldan Cuenya, B., Doi, M., Marks, O., Keune, W., & Mibu, K. (2000). Reflection high-energy electron diffraction and 119sn mössbauer investigation of epitaxial α-sn films. In P. Entel, & D. E. Wolf (Eds.), Structure and Dynamics of Heterogeneous Systems (pp. 251-262). Singapore: World Scientific.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0006-EC1D-1 Version Permalink: https://hdl.handle.net/21.11116/0000-0008-B9E0-A
Genre: Book Chapter

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 Creators:
Roldan Cuenya, Beatriz1, Author           
Doi, M.1, Author
Marks, O1, Author
Keune, W.2, Author
Mibu, K.3, Author
Affiliations:
1Department of Physics, University of Duisburg-Essen, ou_persistent22              
2Laboratorium für Angewandte Physik, Gerhard-Mercator Universität, D-47048 Duisburg, Germany, ou_persistent22              
3Institute for Chemical Research, Kyoto University, Uji, Kyoto-fu 611, Japan, ou_persistent22              

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 Abstract: Structure and growth of epitaxial Sn films on InSb(001), Cu(001) and fcc-Fe/Cu(001) substrates were investigated by reflection high-energy electron diffraction (RHEED) and 119Sn Mössbauer spectroscopy. The Sn films grow epitaxially in the α-Sn(001) phase up to 1100 Å thickness on InSb, up to 5.5 ML on Cu(001), and up to 2.7 ML on fcc-Fe/Cu(001). Various surface reconstructions as a function of Sn coverage have been observed. The in-plane lattice parameter of the α-Sn overlayer was studied as a function of coverage.

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Language(s): eng - English
 Dates: 2000-05
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1142/9789812793652_0024
 Degree: -

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Title: Structure and Dynamics of Heterogeneous Systems
Source Genre: Proceedings
 Creator(s):
Entel, Peter, Editor
Wolf, Dietrich E., Editor
Affiliations:
-
Publ. Info: Singapore : World Scientific
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 251 - 262 Identifier: ISSN: 1554-3374
CoNE: https://pure.mpg.de/cone/journals/resource/1000000000033940