Kwak, S., Höfel, U., Pavone, A., Svensson, J., Ford, O., Hergenhahn, U., et al. (2020). Bayesian inference of Zeff profiles from near-infrared multichannel bremsstrahlung spectrometer by using Gaussian processes at Wendelstein 7-X. Poster presented at 23rd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2020), Virtual.