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  Bayesian inference of Zeff profiles from near-infrared multichannel bremsstrahlung spectrometer by using Gaussian processes at Wendelstein 7-X

Kwak, S., Höfel, U., Pavone, A., Svensson, J., Ford, O., Hergenhahn, U., et al. (2020). Bayesian inference of Zeff profiles from near-infrared multichannel bremsstrahlung spectrometer by using Gaussian processes at Wendelstein 7-X. Poster presented at 23rd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2020), Virtual.

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 Creators:
Kwak, S.1, Author           
Höfel, U.2, Author           
Pavone, A.2, Author           
Svensson, J.1, Author           
Ford, O.2, Author           
Hergenhahn, Uwe3, Author           
König, R.3, Author           
Krychowiak, M.3, Author           
Bozhenkov, S.2, Author           
Fuchert, G.2, Author           
Pasch, E.2, Author           
Brunner, K. J.2, Author           
Knauer, J.2, Author           
Kornejew, P.3, Author           
Trimino Mora, H.2, Author           
Pedersen, T. S.3, Author           
W7-X Team, Max Planck Institute for Plasma Physics, Max Planck Society, Author              
Affiliations:
1Stellarator Dynamics and Transport (E5), Max Planck Institute for Plasma Physics, Max Planck Society, ou_2040306              
2Stellarator Heating and Optimisation (E3), Max Planck Institute for Plasma Physics, Max Planck Society, ou_2040305              
3Stellarator Edge and Divertor Physics (E4), Max Planck Institute for Plasma Physics, Max Planck Society, ou_1856286              

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Language(s): eng - English
 Dates: 2020
 Publication Status: Submitted
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: 23rd Topical Conference on High Temperature Plasma Diagnostics (HTPD 2020)
Place of Event: Virtual
Start-/End Date: 2020-12-14 - 2020-12-17

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