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  Extended energy range analysis for angle-resolved time-of-flight photoelectron spectroscopy

Huth, M., Trützschler, A., Chiang, C.-T., Kamrla, R., Schumann, F. O., & Widdra, W. (2018). Extended energy range analysis for angle-resolved time-of-flight photoelectron spectroscopy. Journal of Applied Physics, 124(16): 164504. doi:10.1063/1.5048515.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0009-2726-1 Version Permalink: https://hdl.handle.net/21.11116/0000-000B-8058-1
Genre: Journal Article

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2018
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https://doi.org/10.1063/1.5048515 (Publisher version)
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 Creators:
Huth, Michael1, Author
Trützschler, Andreas1, Author
Chiang, Cheng-Tien1, Author
Kamrla, Robin1, Author
Schumann, Frank O.1, Author                 
Widdra, Wolf1, Author
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1Max Planck Institute of Microstructure Physics, Max Planck Society, ou_2415691              

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 Abstract: An approximation method for electrostatic time-of-flight (ToF) spectroscopy on photoelectrons distributed over a wide energy range is presented. This method is an extension of conventional analysis and aims at specific energy and angular regions, where distinctly different emission angles and energies are mapped to the same ToF and detector position by the spectrometer. The general formulation and the systematic errors are presented, and a practical example is demonstrated for photoelectrons from Ag(001) with kinetic energies of 0.5–25 eV.

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 Dates: 2018-10-232018-10
 Publication Status: Issued
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 Identifiers: BibTex Citekey: P13657
DOI: 10.1063/1.5048515
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Title: Journal of Applied Physics
  Abbreviation : J. Appl. Phys.
Source Genre: Journal
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Publ. Info: New York, NY : AIP Publishing
Pages: - Volume / Issue: 124 (16) Sequence Number: 164504 Start / End Page: - Identifier: ISSN: 0021-8979
CoNE: https://pure.mpg.de/cone/journals/resource/991042723401880