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Abstract:
Surface extended X-ray absorption fine structure (SEXAFS) measurements were used to study the surface melting of Al(110). The measurements were performed between 100 K and the bulk melting temperature Tm on Al(110) as well as on the reference system Al(111) which does not show surface melting. Based on a cumulant-expansion analysis of the SEXAFS data, surface melting of Al(110) was observed via an anisotropy of the Debye–Waller factor. This anisotropy can be explained by a residual order of the quasi-liquid which consists of intact rows or segments of them moving with liquid-like mobilities. The measurements also yield an Einstein temperature of 317 K and allow us to determine a linear thermal expansion coefficient of (2.7±0.5)×10−5 K−1.
