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  The dimers stay intact: a quantitative photoelectron study of the adsorption system Si{100} (2x1)-C2H4

Baumgärtel, P., Lindsay, R., Schaff, O., Gießel, T., Terborg, R., Hoeft, J. T., et al. (1999). The dimers stay intact: a quantitative photoelectron study of the adsorption system Si{100} (2x1)-C2H4. New Journal of Physics, 1, 20.1-20.15. doi:10.1088/1367-2630/1/1/320.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0008-BC01-3 Version Permalink: https://hdl.handle.net/21.11116/0000-0008-BC04-0
Genre: Journal Article

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P_Baumgärtel_1999_New_J._Phys._1_20.pdf (Publisher version), 365KB
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P_Baumgärtel_1999_New_J._Phys._1_20.pdf
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1999
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 Creators:
Baumgärtel, Peter1, Author           
Lindsay, Robert1, Author           
Schaff, Oliver1, Author           
Gießel, Tatjana2, Author           
Terborg, Ralf1, Author           
Hoeft, Jon Tobias3, Author           
Polcik, Martin3, Author           
Bradshaw, Alexander M.1, Author           
Carbone, M.4, Author
Piancastelli, M. N.4, Author
Zanoni, R.5, Author
Toomes, R L6, Author
Woodruff, David Phillip6, Author
Affiliations:
1Fritz Haber Institute, Max Planck Society, ou_24021              
2Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546              
3Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022              
4Department of Chemical Sciences and Technologies, University of Roma ‘TorVergata’, Italy, ou_persistent22              
5Department of Chemistry, University of Roma ‘La Sapienza’,Italy, ou_persistent22              
6Department of Physics, University of Warwick, UK, ou_persistent22              

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 Abstract: Using the technique of photoelectron diffraction in the scanned energy mode we show that the Si dimer separation on the Si{100} surface following the adsorption of ethene (ethylene) is 2.36(±0.21) Å. This value is only very slightly larger than on the clean surface and shows that the dimer remains intact, thus providing a clear quantitative experimental resolution of a long controversy in the literature. The C-C and C-Si separations are 1.62±0.08 Å and 1.90±0.01 Å, respectively, the former indicating a bond order of less than one.

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Language(s): eng - English
 Dates: 1999-07-081999-05
 Publication Status: Issued
 Pages: 15
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1088/1367-2630/1/1/320
 Degree: -

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Title: New Journal of Physics
  Abbreviation : New J. Phys.
Source Genre: Journal
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Publ. Info: Bristol : IOP Publishing
Pages: 15 Volume / Issue: 1 Sequence Number: - Start / End Page: 20.1 - 20.15 Identifier: ISSN: 1367-2630
CoNE: https://pure.mpg.de/cone/journals/resource/954926913666