Can machine learning bring atom probe microscopy closer to analytical 
atomic-scale tomography

Gault, Baptiste

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Can machine learning bring atom probe microscopy closer to analytical atomic-scale tomography

Gault, B. (2019). Can machine learning bring atom probe microscopy closer to analytical atomic-scale tomography. Talk presented at 12th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC 19). Kyoto, Japan. 2019-10-20 - 2019-10-25.

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Item Permalink: https://hdl.handle.net/21.11116/0000-0009-29AE-6 Version Permalink: https://hdl.handle.net/21.11116/0000-0009-2A1C-A

Genre: Talk

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Creators:
Gault, Baptiste^{1, 2}, Author

Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384
2Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK, ou_persistent22

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Language(s): eng - English

Dates: Created: 2019-10-25

Publication Status: Not specified

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Title: 12th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC 19)

Place of Event: Kyoto, Japan

Start-/End Date: 2019-10-20 - 2019-10-25

Invited: Yes

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