English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Talk

Can machine learning bring atom probe microscopy closer to analytical atomic-scale tomography

MPS-Authors
/persons/resource/persons185411

Gault,  Baptiste
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;
Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK;

External Resource
No external resources are shared
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Gault, B. (2019). Can machine learning bring atom probe microscopy closer to analytical atomic-scale tomography. Talk presented at 12th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC 19). Kyoto, Japan. 2019-10-20 - 2019-10-25.


Cite as: http://hdl.handle.net/21.11116/0000-0009-29AE-6
Abstract
There is no abstract available