English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
  Can machine learning bring atom probe microscopy closer to analytical atomic-scale tomography

Gault, B. (2019). Can machine learning bring atom probe microscopy closer to analytical atomic-scale tomography. Talk presented at 12th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC 19). Kyoto, Japan. 2019-10-20 - 2019-10-25.

Item is

Files

show Files

Locators

show

Creators

show
hide
 Creators:
Gault, Baptiste1, 2, Author              
Affiliations:
1Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society, ou_1863384              
2Imperial College, Royal School of Mines, Department of Materials, London, SW7 2AZ, UK, ou_persistent22              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2019-10-25
 Publication Status: Not specified
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

Event

show
hide
Title: 12th International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC 19)
Place of Event: Kyoto, Japan
Start-/End Date: 2019-10-20 - 2019-10-25
Invited: Yes

Legal Case

show

Project information

show

Source

show