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  Observation of the critical state to multiple-type Dirac semimetal phases in KMgBi

Liu, D. F., Wei, L. Y., Le, C. C., Wang, H. Y., Zhang, X., Kumar, N., et al. (2021). Observation of the critical state to multiple-type Dirac semimetal phases in KMgBi. Journal of Applied Physics, 129(23): 235109. doi:10.1063/5.0045466.

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https://doi.org/10.1063/5.0045466 (Publisher version)
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https://arxiv.org/abs/2102.08433 (Preprint)
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 Creators:
Liu, D. F.1, Author           
Wei, L. Y.2, Author
Le, C. C.2, Author
Wang, H. Y.2, Author
Zhang, X.2, Author
Kumar, N.2, Author
Shekhar, C.2, Author
Schröter, N. B. M.2, Author
Li, Y. W.2, Author
Pei, D.2, Author
Xu, L. X.2, Author
Dudin, P.2, Author
Kim, T. K.2, Author
Cacho, C.2, Author
Fujii, J.2, Author
Vobornik, I.2, Author
Wang, M. X.2, Author
Yang, L. X.2, Author
Liu, Z. K.2, Author
Guo, Y. F.2, Author
Hu, J. P.2, AuthorFelser, C.2, AuthorParkin, S. S. P.1, Author                 Chen, Y. L.2, Author more..
Affiliations:
1Nano-Systems from Ions, Spins and Electrons, Max Planck Institute of Microstructure Physics, Max Planck Society, ou_3287476              
2external, ou_persistent22              

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Free keywords: TOTAL-ENERGY CALCULATIONS; DISCOVERY; INSULATORPhysics;
 Abstract: Dirac semimetals are classified into different phases based on the types of Dirac fermions. Tuning the transition among different types of Dirac fermions in one system remains a challenge. Recently, KMgBi was predicted to be located at a critical state in which various types of Dirac fermions can be induced owing to the existence of a flatband. Here, we carried out systematic studies on the electronic structure of KMgBi single crystals by combining angle-resolve photoemission spectroscopy and scanning tunneling microscopy/spectroscopy. The flatband was clearly observed near the Fermi level. We also revealed a small bandgap of ∼20 meV between the flatband and the conduction band. These results demonstrate the critical states of KMgBi that transition among various types of Dirac fermions can be tuned in one system.

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Language(s): eng - English
 Dates: 2021-06-182021-06-21
 Publication Status: Issued
 Pages: 7
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: ISI: 000681701500001
DOI: 10.1063/5.0045466
 Degree: -

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Title: Journal of Applied Physics
  Abbreviation : J. Appl. Phys.
Source Genre: Journal
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Publ. Info: New York, NY : AIP Publishing
Pages: - Volume / Issue: 129 (23) Sequence Number: 235109 Start / End Page: - Identifier: ISSN: 0021-8979
CoNE: https://pure.mpg.de/cone/journals/resource/991042723401880