English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Random and Adversarial Bit Error Robustness: Energy-Efficient and Secure DNN Accelerators

Stutz, D., Chandramoorthy, N., Hein, M., & Schiele, B. (2023). Random and Adversarial Bit Error Robustness: Energy-Efficient and Secure DNN Accelerators. IEEE Transactions on Pattern Analysis and Machine Intelligence, 45(3), 3632-3647. doi:10.1109/TPAMI.2022.3181972.

Item is

Basic

show hide
Genre: Journal Article
Latex : Random and Adversarial Bit Error Robustness: {E}nergy-Efficient and Secure {DNN} Accelerators

Files

show Files
hide Files
:
arXiv:2104.08323.pdf (Preprint), 3MB
Name:
arXiv:2104.08323.pdf
Description:
File downloaded from arXiv at 2021-11-22 09:36 arXiv admin note: substantial text overlap with arXiv:2006.13977
OA-Status:
Not specified
Visibility:
Public
MIME-Type / Checksum:
application/pdf / [MD5]
Technical Metadata:
Copyright Date:
-
Copyright Info:
© 2023 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works

Locators

show

Creators

show
hide
 Creators:
Stutz, David1, Author           
Chandramoorthy, Nandhini2, Author
Hein, Matthias2, Author
Schiele, Bernt1, Author                 
Affiliations:
1Computer Vision and Machine Learning, MPI for Informatics, Max Planck Society, ou_1116547              
2External Organizations, ou_persistent22              

Content

show

Details

show
hide
Language(s): eng - English
 Dates: 2021-04-1620232023
 Publication Status: Issued
 Pages: 39 p.
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: BibTex Citekey: StutzTPAMI23
DOI: 10.1109/TPAMI.2022.3181972
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: IEEE Transactions on Pattern Analysis and Machine Intelligence
  Other : IEEE Trans. Pattern Anal. Mach. Intell.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: Piscataway, NJ : IEEE
Pages: - Volume / Issue: 45 (3) Sequence Number: - Start / End Page: 3632 - 3647 Identifier: ISSN: 0162-8828
CoNE: https://pure.mpg.de/cone/journals/resource/954925479551