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  Mott memristors based on field-induced carrier avalanche multiplication

Peronaci, F., Ameli, S., Takayoshi, S., Landsman, A. S., & Oka, T. (2023). Mott memristors based on field-induced carrier avalanche multiplication. Physical Review B, 107(7): 075154. doi:10.1103/PhysRevB.107.075154.

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2104.00559.pdf (Preprint), 3MB
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 Creators:
Peronaci, Francesco1, Author           
Ameli, Sara1, Author           
Takayoshi, Shintaro1, Author           
Landsman, Alexandra S.2, Author
Oka, Takashi1, Author           
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1Max Planck Institute for the Physics of Complex Systems, Max Planck Society, ou_2117288              
2external, ou_persistent22              

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 Abstract: We present a theory of Mott memristors whose working principle is the nonlinear carrier avalanche multiplica-tion in Mott insulators subject to strong electric fields. The internal state of the memristor, which determines its resistance, is encoded in the density of doublon and hole excitations in the Mott insulator. In the current-voltage characteristic, insulating and conducting states are separated by a negative-differential-resistance region, leading to hysteretic behavior. Under oscillating voltage, the response of a voltage-controlled, nonpolar memristive system is obtained, with retarded current and pinched hysteresis loop. As a first step towards neuromorphic applications, we demonstrate self-sustained spiking oscillations in a circuit with a parallel capacitor. Being based on electronic excitations only, this memristor is up to several orders of magnitude faster than previous proposals relying on Joule heating or ionic drift.

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Language(s): eng - English
 Dates: 2023-02-272023-02-15
 Publication Status: Issued
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Title: Physical Review B
  Abbreviation : Phys. Rev. B
Source Genre: Journal
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Publ. Info: Woodbury, NY : American Physical Society
Pages: - Volume / Issue: 107 (7) Sequence Number: 075154 Start / End Page: - Identifier: ISSN: 1098-0121
CoNE: https://pure.mpg.de/cone/journals/resource/954925225008