English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
  Refining edge impurity profiles using molecular gas puff modeling for CXRS measurements

McKay, K., Cruz-Zabala, D. J., Viezzer, E., Lopez-Cansino, R., Rueda-Rueda, J., Cano Megias, P., et al. (2024). Refining edge impurity profiles using molecular gas puff modeling for CXRS measurements. Poster presented at 50th EPS Conference on Plasma Physics, Salamanca.

Item is

Files

show Files

Locators

show

Creators

hide
 Creators:
McKay, K.1, Author
Cruz-Zabala, D. J.1, Author
Viezzer, E.1, Author
Lopez-Cansino, R.1, Author
Rueda-Rueda, J.1, Author
Cano Megias, P.2, Author                 
Rodriguez-Gonzalez, A.1, Author
Plank, U.2, Author                 
McDermott, R. M.2, Author                 
Dux, R.2, Author                 
ASDEX Upgrade Team, Max Planck Institute for Plasma Physics, Max Planck Society, Author              
Affiliations:
1External Organizations, ou_persistent22              
2Physics of the Plasma Edge (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_3504923              

Content

show

Details

hide
Language(s): eng - English
 Dates: 2024
 Publication Status: Submitted
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

Event

hide
Title: 50th EPS Conference on Plasma Physics
Place of Event: Salamanca
Start-/End Date: 2024-07-08 - 2024-07-12

Legal Case

show

Project information

show

Source

show