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  Refining edge impurity profiles using molecular gas puff modeling for CXRS measurements

McKay, K., Cruz-Zabala, D. J., Viezzer, E., Lopez-Cansino, R., Rueda-Rueda, J., Cano Megias, P., et al. (2024). Refining edge impurity profiles using molecular gas puff modeling for CXRS measurements. Poster presented at 50th EPS Conference on Plasma Physics, Salamanca.

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Item Permalink: https://hdl.handle.net/21.11116/0000-000F-9429-C Version Permalink: https://hdl.handle.net/21.11116/0000-000F-942A-B
Genre: Poster

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 Creators:
McKay, K.1, Author
Cruz-Zabala, D. J.1, Author
Viezzer, E.1, Author
Lopez-Cansino, R.1, Author
Rueda-Rueda, J.1, Author
Cano Megias, P.2, Author                 
Rodriguez-Gonzalez, A.1, Author
Plank, U.2, Author                 
McDermott, R. M.2, Author                 
Dux, R.2, Author                 
ASDEX Upgrade Team, Max Planck Institute for Plasma Physics, Max Planck Society, Author              
Affiliations:
1External Organizations, ou_persistent22              
2Physics of the Plasma Edge (E2), Max Planck Institute for Plasma Physics, Max Planck Society, ou_3504923              

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Language(s): eng - English
 Dates: 2024
 Publication Status: Submitted
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: -
 Degree: -

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Title: 50th EPS Conference on Plasma Physics
Place of Event: Salamanca
Start-/End Date: 2024-07-08 - 2024-07-12

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