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  Structure and electronic properties of step edges in the aluminium oxide film on NiAl(110)

Heinke, L., Lichtenstein, L., Simon, G. H., König, T., Heyde, M., & Freund, H.-J. (2010). Structure and electronic properties of step edges in the aluminium oxide film on NiAl(110). Physical Review B, 82, 075430-1-075430-6. Retrieved from http://dx.doi.org/10.1103/PhysRevB.82.075430.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-F774-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-F774-C
Genre: Journal Article

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 Creators:
Heinke, Lars1, Author           
Lichtenstein, Leonid1, Author           
Simon, Georg H.1, Author           
König, Thomas1, Author           
Heyde, Markus1, Author           
Freund, Hans-Joachim1, Author           
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1Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022              

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Language(s): eng - English
 Dates: 2010
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: eDoc: 499042
URI: http://dx.doi.org/10.1103/PhysRevB.82.075430
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Title: Physical Review B
Source Genre: Journal
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Pages: - Volume / Issue: 82 Sequence Number: - Start / End Page: 075430-1 - 075430-6 Identifier: -