Study of thin oxide films with NC-AFM: Atomically resolved imaging and beyond

Heyde, Markus; Simon, Georg Hermann; König, Thomas

doi:10.1007/978-3-642-01495-6_7

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Study of thin oxide films with NC-AFM: Atomically resolved imaging and beyond

Heyde, M., Simon, G. H., & König, T. (2009). Study of thin oxide films with NC-AFM: Atomically resolved imaging and beyond. In S. Morita, F. J. Giessibl, & R. Wiesendanger (Eds.), Noncontact Atomic Force Microscopy (pp. 143-167). Berlin: Springer.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-FB36-7 Version Permalink: https://hdl.handle.net/21.11116/0000-0005-C851-E

Genre: Book Chapter

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Creators:
Heyde, Markus¹, Author
Simon, Georg Hermann¹, Author
König, Thomas¹, Author

Affiliations:
1Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022

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Language(s): eng - English

Dates: Date issued: 2009

Publication Status: Issued

Pages: -

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Table of Contents: -

Rev. Type: Peer

Identifiers: eDoc: 455745
DOI: 10.1007/978-3-642-01495-6_7

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Title: Noncontact Atomic Force Microscopy

Source Genre: Book

Creator(s):
Morita, Seizo, Editor
Giessibl, Franz J., Editor
Wiesendanger, Roland, Editor

Affiliations:
-

Publ. Info: Berlin : Springer

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 143 - 167 Identifier: ISBN: 978-3-642-01494-9

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Title: NanoScience and Technology

Source Genre: Series

Creator(s):
Avouris, P., Editor
Bhushan, B., Editor
Bimberg, D., Editor
von Klitzing, K., Editor
Sakaki, H., Editor
Wiesendanger, R., Editor

Affiliations:
-

Publ. Info: -

Pages: - Volume / Issue: 2 Sequence Number: - Start / End Page: - Identifier: -