Probing adsorption sites on thin oxide films by dynamic force microscopy

Heyde, Markus; Simon, Georg H.; Rust, Hans-Peter; Freund, Hans-Joachim

doi:10.1063/1.2424432

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Probing adsorption sites on thin oxide films by dynamic force microscopy

Heyde, M., Simon, G. H., Rust, H.-P., & Freund, H.-J. (2006). Probing adsorption sites on thin oxide films by dynamic force microscopy. Applied Physics Letters, 89(26): 263107. doi:10.1063/1.2424432.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-069D-8 Version Permalink: https://hdl.handle.net/21.11116/0000-0005-E715-F

Genre: Journal Article

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Creators:
Heyde, Markus¹, Author
Simon, Georg H.¹, Author
Rust, Hans-Peter¹, Author
Freund, Hans-Joachim¹, Author

Affiliations:
1Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022

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Language(s): eng - English

Dates: Date issued: 2006

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 312500
DOI: 10.1063/1.2424432

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Title: Applied Physics Letters

Alternative Title : Appl. Phys. Lett.

Source Genre: Journal

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Pages: - Volume / Issue: 89 (26) Sequence Number: 263107 Start / End Page: - Identifier: -