A double lamellae dropoff etching procedure for tungsten tips attached to 
tuning fork atomic force microscopy/scanning tunneling microscopy sensors

Kulawik, Maria; Nowicki, Marek; Thielsch, Gero; Cramer, Ludger; Rust, Hans-Peter; Freund, Hans-Joachim; Pearl, Thomas P.; Weiss, Paul S.

doi:10.1063/1.1532833

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A double lamellae dropoff etching procedure for tungsten tips attached to tuning fork atomic force microscopy/scanning tunneling microscopy sensors

Kulawik, M., Nowicki, M., Thielsch, G., Cramer, L., Rust, H.-P., Freund, H.-J., et al. (2003). A double lamellae dropoff etching procedure for tungsten tips attached to tuning fork atomic force microscopy/scanning tunneling microscopy sensors. Review of Scientific Instruments, 74(2), 1027-1030. doi:10.1063/1.1532833.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-126D-4 Version Permalink: https://hdl.handle.net/21.11116/0000-0006-8836-4

Genre: Journal Article

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Creators:
Kulawik, Maria¹, Author
Nowicki, Marek¹, Author
Thielsch, Gero¹, Author
Cramer, Ludger¹, Author
Rust, Hans-Peter¹, Author
Freund, Hans-Joachim¹, Author
Pearl, Thomas P., Author
Weiss, Paul S., Author

Affiliations:
1Chemical Physics, Fritz Haber Institute, Max Planck Society, ou_24022

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Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 175381
DOI: 10.1063/1.1532833

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Title: Review of Scientific Instruments

Alternative Title : Rev. Sci. Instrum.

Source Genre: Journal

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Pages: - Volume / Issue: 74 (2) Sequence Number: - Start / End Page: 1027 - 1030 Identifier: -