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  Transmission electron microscopical studies of the layered structure of the ternary semiconductor CuIn5Se8

Tham, A. T., Su, D. S., Neumann, W., Schubert-Bischoff, P., Beilharz, C., & Benz, K. W. (2001). Transmission electron microscopical studies of the layered structure of the ternary semiconductor CuIn5Se8. Crystal Research and Technology, 36(3), 303-308. doi:10.1002/1521-4079(200103)36:3<303:AID-CRAT303>3.0.CO;2-x.

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Transmission_electron_Chryst_Res_Tech_36_2001.pdf (Any fulltext), 820KB
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Transmission_electron_Chryst_Res_Tech_36_2001.pdf
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2001
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Wiley
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 Creators:
Tham, Anh Tuan1, Author           
Su, Dang Sheng1, Author           
Neumann, Wolfgang, Author
Schubert-Bischoff, Peter, Author
Beilharz, C., Author
Benz, K. W., Author
Affiliations:
1Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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Free keywords: TEM; CuInSe; layer cooperation with the external affiliations
 Abstract: The structure of the off-stoichiometric In-rich ternary phase CuIn5Se8 was studied by means of electron diffraction and high-resolution electron microscopy. The compound shows a layered structure with a 7-layer stacking sequence of closed-packed planes, which contains both cubic and hexagonal stacking of Se atoms. The studied CuIn5Se8 bulk crystal is known as the b-phase of this compound.

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Language(s): eng - English
 Dates: 2000-11-022001-02-282001-03
 Publication Status: Issued
 Pages: 6
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Degree: -

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Title: Crystal Research and Technology
Source Genre: Journal
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Publ. Info: Berlin, Fed. Rep. of Germany : Wiley-VCH
Pages: 6 Volume / Issue: 36 (3) Sequence Number: - Start / End Page: 303 - 308 Identifier: ISSN: 0232-1300
CoNE: https://pure.mpg.de/cone/journals/resource/954928496432