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  TEM and EELS characterisation of ZrO2 thin films obtained by self-assembled monolayer-mediated deposition

Roddatis, V. V., Su, D. S., Beckmann, E., Jentoft, F. C., Fischer, A., Kröhnert, J., et al. (2000). TEM and EELS characterisation of ZrO2 thin films obtained by self-assembled monolayer-mediated deposition. Poster presented at Autumn School on Materials Science and Electron Microscopy 2000, Berlin, Germany.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-1A92-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0011-1A93-8
Genre: Poster

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 Creators:
Roddatis, Vladimir V.1, Author           
Su, Dang Sheng1, Author           
Beckmann, Erich1, Author           
Jentoft, Friederike C.1, Author           
Fischer, Armin1, Author           
Kröhnert, Jutta1, Author           
Schlögl, Robert1, Author           
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1Inorganic Chemistry, Fritz Haber Institute, Max Planck Society, ou_24023              

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Free keywords: Project 3: Zirconium oxide model systems
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Language(s): eng - English
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 Identifiers: eDoc: 1281
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Title: Autumn School on Materials Science and Electron Microscopy 2000
Place of Event: Berlin, Germany
Start-/End Date: 2000-10-10 - 2000-10-15

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