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Journal Article

High-Precision Metrology of Highly Charged Ions via Relativistic Resonance Fluorescence

MPS-Authors
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Postavaru,  Octavian
Division Prof. Dr. Christoph H. Keitel, MPI for Nuclear Physics, Max Planck Society;

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Harman,  Zoltan
Division Prof. Dr. Christoph H. Keitel, MPI for Nuclear Physics, Max Planck Society;

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Keitel,  Christoph H.
Division Prof. Dr. Christoph H. Keitel, MPI for Nuclear Physics, Max Planck Society;

External Resource

http://link.aps.org/doi/10.1103/PhysRevLett.106.033001
(Publisher version)

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Citation

Postavaru, O., Harman, Z., & Keitel, C. H. (2011). High-Precision Metrology of Highly Charged Ions via Relativistic Resonance Fluorescence. Physical Review Letters, 106(3): 033001. doi:10.1103/PhysRevLett.106.033001.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0012-5F47-5
Abstract
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