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Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device

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Tawara,  Hiroyuki
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Sakaue, H. A., Yamamoto, N., Morita, S., Nakamura, N., Chen, C., Kato, D., et al. (2011). Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device. Journal of Applied Physcis, 109(7): 073304. doi:10.1063/1.3549707.


Cite as: http://hdl.handle.net/11858/00-001M-0000-000F-134C-D
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