Electron density dependence of intensity ratio for FeXXII extreme ultraviolet 
emission lines arising from different ground levels in electron beam ion trap 
and large helical device

Sakaue, H. A.; Yamamoto, N.; Morita, S.; Nakamura, N.; Chen, C.; Kato, D.; Kikuchi, H.; Murakami, I.; Ohtani, S.; Tanuma, H.; Watanabe, T.; Tawara, Hiroyuki

doi:10.1063/1.3549707

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Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device

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Tawara, Hiroyuki
Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society;

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Sakaue, H. A., Yamamoto, N., Morita, S., Nakamura, N., Chen, C., Kato, D., et al. (2011). Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device. Journal of Applied Physcis, 109(7): 073304. doi:10.1063/1.3549707.

Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-134C-D

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