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Journal Article

Pressure Dependence of Thickness and Refractive Index of Thin PMMA-Films Investigated by Surface Plasmon and Optical Waveguide Spectroscopy

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Kleideiter,  G.
MPI for Polymer Research, Max Planck Society;

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Knoll,  Wolfgang
MPI for Polymer Research, Max Planck Society;

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Kleideiter, G., Lechner, M. D., & Knoll, W. (1999). Pressure Dependence of Thickness and Refractive Index of Thin PMMA-Films Investigated by Surface Plasmon and Optical Waveguide Spectroscopy. Macromolecular Chemistry and Physics, 200, 1028-1033.


Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-5296-3
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