English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Pressure Dependence of Thickness and Refractive Index of Thin PMMA-Films Investigated by Surface Plasmon and Optical Waveguide Spectroscopy

MPS-Authors
/persons/resource/persons48188

Kleideiter,  G.
MPI for Polymer Research, Max Planck Society;

/persons/resource/persons48198

Knoll,  Wolfgang
MPI for Polymer Research, Max Planck Society;

External Resource
No external resources are shared
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Kleideiter, G., Lechner, M. D., & Knoll, W. (1999). Pressure Dependence of Thickness and Refractive Index of Thin PMMA-Films Investigated by Surface Plasmon and Optical Waveguide Spectroscopy. Macromolecular Chemistry and Physics, 200, 1028-1033.


Cite as: http://hdl.handle.net/11858/00-001M-0000-000F-5296-3
Abstract
There is no abstract available