Multivariate characterization of ultra-thin nanofunctional plasma polymer films 
using ToF-SIMS analysis

von Gradowski, M.; Wahl, M.; Förch, Renate; Hilgers, H.

doi:10.1002/sia.1853

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Multivariate characterization of ultra-thin nanofunctional plasma polymer films using ToF-SIMS analysis

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Förch, Renate
MPI for Polymer Research, Max Planck Society;

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von Gradowski, M., Wahl, M., Förch, R., & Hilgers, H. (2004). Multivariate characterization of ultra-thin nanofunctional plasma polymer films using ToF-SIMS analysis. Surface and Interface Analysis, 36(8), 1114-1118. doi:10.1002/sia.1853.

Cite as: https://hdl.handle.net/11858/00-001M-0000-000F-5FFE-4

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