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Quantitative Analyse von Bildkontrasten der Hochauflösenden Hochspannungselektronenmikroskopie

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von Hochmeister,  K.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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von Hochmeister, K. (2004). Quantitative Analyse von Bildkontrasten der Hochauflösenden Hochspannungselektronenmikroskopie. PhD Thesis, Universität Stuttgart, Stuttgart.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-297E-3
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